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Safe Launch Objective for Zero Defects |
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Carry out additional inspections, electrical testing, fail analysis & Quality gating on initial volume ramp units to ensure required end customer quality plus identify areas for additional Zero Defect improvements.
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Elementary process structure data analysis (Class probe data analysis)
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Wafer Unit probe data analysis focus
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Final test data analysis focus
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Burn-In fail analysis of safe launch material
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Manufacturing screening (SBL, PAT, ...) early evaluation |
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Additional Testing and process control
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Data review for all Safe Launch lots
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